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• W2111934834 abstract "In present-day society, we encounter optical systems on a daily basis. Most people have a DVD player capable of playing content stored on an optical disc, Big Brother is watching us nearly everywhere using surveillance cameras and we consider it to be normal to take photographs with our mobile phone. Also, in less visible areas, such as ultrafast fiber-based data transfer, we rely on optical technology. Although these applications might be considered advanced by the general public, they mostly do not reflect the state of perfection that is currently needed by the scientific and high-tech community. When we speak of advanced optical systems in this context we refer to highly corrected optical systems or optical systems having extreme optical properties. For example, in astronomy, huge optical telescopes are used to produce images of faint astronomical objects located deep in space and also in microscopy, high quality optics are applied to visualize the smallest possible details in a sample such as a living cell. However, by far the most cutting edge optical technology is applied in the semiconductor industry. A process called optical lithography is used to transfer geometrical patterns, that are part of a chip design, into a layer of photosensitive material. Using chemical technology these patterns are developed into metallic and insulating structures and, repeating lithographic pattern transfer and chemical development several times in succession, it is possible to produce a working electronic circuit or chip at the nanometer scale. The above mentioned applications of optical technology have in common that they require extremely accurate optical components. This is because the objects that they try to visualize or image are so small and faint that even the smallest aberration effects can completely conceal the features of interest. One might think that reducing the aberrations to a low level simplifies the task of simulating these systems. Unfortunately, this is not true. In fact, at this level of perfection, various optical phenomena, that would otherwise have negligible effect in comparison to the imperfections of the optical system, become significant. Therefore, existing optical methods should be extended to properly include these effects in order to allow a sensible analysis of the performance of optical systems in this regime. In addition, also the errors introduced by approximations used in image simulation models become significant and this makes it favorable to apply those methods with the smallest number of incorporated approximations. Although there has been, in recent years, a large research effort by the optical community to extend existing optical methods to correctly describe this class of systems, the results so far have not been totally satisfactory. As an alternative, we present in this thesis a novel optical model that we believe is superior in the accurate description and simulation of image formation. The formation of an image by an aberrated optical system is accurately described by the corresponding diffraction integral. However, until recently, this integral could only be evaluated numerically to obtain the three-dimensional image structure. This changed in 2002 with the introduction of the Extended Nijboer-Zernike (ENZ) theory. This theoretical framework, extensively described in this thesis, provides a generally valid analytic solution to the diffraction integral. Based on this result we have constructed a novel imaging model that includes all relevant physical effects and applies very few approximations. The resulting ENZ imaging method proposed in this thesis is, therefore, well suited to accurately describe image formation by advanced optical imaging systems. The second important contribution presented in this thesis pertains to the quality assessment of optical systems. It is shown that it is possible to determine the quality of an optical system by evaluating the image it produces from a point object. This is possible because the analytic results provided by the ENZ theory allow us to devise an expression for the intensity image of a point object. Matching the measurement data with this expression enables complete characterization of the optical system under study without the need of additional complicated optical set-ups. Altogether, we present in this thesis a comprehensive ENZ formalism that can be used to accurately simulate image formation by a large variety of imaging systems. The most important feature of ENZ imaging is its high accuracy that follows from the semi-analytic nature of the ENZ theory and the few approximations applied in the ENZ imaging model. Additionally it is shown that the aberrations of an optical system can be obtained from intensity measurements alone, introducing an appealing alternative to interferometric methods that are commonly applied for this purpose. Finally, both applications of the ENZ theory are illustrated by a number of practical examples, clearly showing the large potential of the ENZ formalism in the field of advanced optical imaging systems." @default.
• W2111934834 created "2016-06-24" @default.
• W2111934834 creator A5076341214 @default.
• W2111934834 date "2010-02-05" @default.
• W2111934834 modified "2023-09-28" @default.
• W2111934834 title "The Extended Nijboer-Zernike Diffraction Theory and its Applications" @default.
• W2111934834 hasPublicationYear "2010" @default.
• W2111934834 type Work @default.
• W2111934834 sameAs 2111934834 @default.
• W2111934834 citedByCount "6" @default.
• W2111934834 countsByYear W21119348342012 @default.
• W2111934834 countsByYear W21119348342014 @default.
• W2111934834 countsByYear W21119348342015 @default.
• W2111934834 countsByYear W21119348342018 @default.
• W2111934834 crossrefType "journal-article" @default.
• W2111934834 hasAuthorship W2111934834A5076341214 @default.
• W2111934834 hasConcept C120665830 @default.
• W2111934834 hasConcept C121332964 @default.
• W2111934834 hasConcept C127313418 @default.
• W2111934834 hasConcept C151730666 @default.
• W2111934834 hasConcept C151857401 @default.
• W2111934834 hasConcept C2779343474 @default.
• W2111934834 hasConcept C41008148 @default.
• W2111934834 hasConcept C76155785 @default.
• W2111934834 hasConceptScore W2111934834C120665830 @default.
• W2111934834 hasConceptScore W2111934834C121332964 @default.
• W2111934834 hasConceptScore W2111934834C127313418 @default.
• W2111934834 hasConceptScore W2111934834C151730666 @default.
• W2111934834 hasConceptScore W2111934834C151857401 @default.
• W2111934834 hasConceptScore W2111934834C2779343474 @default.
• W2111934834 hasConceptScore W2111934834C41008148 @default.
• W2111934834 hasConceptScore W2111934834C76155785 @default.
• W2111934834 hasLocation W21119348341 @default.
• W2111934834 hasOpenAccess W2111934834 @default.
• W2111934834 hasPrimaryLocation W21119348341 @default.
• W2111934834 hasRelatedWork W1510792260 @default.
• W2111934834 hasRelatedWork W1658472922 @default.
• W2111934834 hasRelatedWork W1971099034 @default.
• W2111934834 hasRelatedWork W1982670023 @default.
• W2111934834 hasRelatedWork W1988310924 @default.
• W2111934834 hasRelatedWork W2012743540 @default.
• W2111934834 hasRelatedWork W2021583756 @default.
• W2111934834 hasRelatedWork W2040937058 @default.
• W2111934834 hasRelatedWork W2050227055 @default.
• W2111934834 hasRelatedWork W2053773388 @default.
• W2111934834 hasRelatedWork W2059425017 @default.
• W2111934834 hasRelatedWork W2078549909 @default.
• W2111934834 hasRelatedWork W2090763475 @default.
• W2111934834 hasRelatedWork W2103824900 @default.
• W2111934834 hasRelatedWork W2117587029 @default.
• W2111934834 hasRelatedWork W2167218081 @default.
• W2111934834 hasRelatedWork W2499581105 @default.
• W2111934834 hasRelatedWork W2729486661 @default.
• W2111934834 hasRelatedWork W46333234 @default.
• W2111934834 hasRelatedWork W2786245298 @default.
• W2111934834 isParatext "false" @default.
• W2111934834 isRetracted "false" @default.
• W2111934834 magId "2111934834" @default.
• W2111934834 workType "article" @default.