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- W2112572785 abstract "This paper discusses the approach of redwing RF panmetnc test by using statistical techniques. Lincar regression and logistic regression are used to investigate the rclationslup bctwccn thc yield and defect level as well as the correlation among parametric tests. The analysis is then petfonncd on manuracturing data collected from an low noise amplifier (LNA) product built using IBM Silicon Gennaniuni (SiCe) technologies. Separate data sets wcrc used for modcl training and model validation. During the validation process. the model was clieckcd for its predictive capab impact on both the yield and defect level. Results show that eliminating all the RF testing will negatively impact the yield: lllc defect level or both. On the other hand. removing some RF tests and keeping a few selected othcrs can succcssfull? reduce test time without haring a negative impact on thc defect level. Based on the data sets 'analyzed. it was concluded that parametric tests should be carefully designed based on device physics in order to reduce the nunibcr of panmetric tests required." @default.
- W2112572785 created "2016-06-24" @default.
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- W2112572785 date "2004-06-22" @default.
- W2112572785 modified "2023-09-27" @default.
- W2112572785 title "Reducing RF parameter tests for test cost reduction: device model, hypothesis testing and experiment verification" @default.
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- W2112572785 doi "https://doi.org/10.1109/ectc.2003.1216287" @default.
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