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• W2113045124 abstract "There are two methods for applying path delay tests to a sequential circuit. We show that all path delay faults that can affect the rated-clock operation of the circuit are testable by the variable-clock method. Also, all path delay faults that are untestable by the variable-clock method are, in fact, untestable by the rated-clock method. However, some faults tested by the variable-clock method may be incapable of affecting the rated-clock operation. Our study is based on a finite-state machine model in which fault-free transitions are shown by green arcs. Faulty transitions are shown by red arcs. A test traverses successive arcs until a faulty output occurs. A variable-clock test can exercise more flexibility in selecting from green and red arcs. It can cover all functional paths, but may find only a proper subset of untestable paths. Our analysis assumes a delay fault, consisting of either a singly-testable path or multiply-testable paths, and hence corresponds to non-robust detection." @default.
• W2113045124 created "2016-06-24" @default.
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• W2113045124 date "2002-11-27" @default.
• W2113045124 modified "2023-09-30" @default.
• W2113045124 title "Path delay testing: variable-clock versus rated-clock" @default.
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• W2113045124 doi "https://doi.org/10.1109/icvd.1998.646651" @default.
• W2113045124 hasPublicationYear "2002" @default.
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