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- W2114643795 abstract "Reasons for defect generation in edge-defined film-fed grown (EFG) silicon ribbons are studied. One factor is the erosion of the die capillary surface. On the capillary surface immersed in the liquid silicon, a thin film of silicon carbide is created. Mechanisms for this phenomenon are described for different die materials. SiC particles are eroded from the die by melt convection during growth. SiC particles reaching the ribbon growth interface become sites for defect generation. Microtwins, stacking faults, as well as high-angle grain boundaries are studied with transmission electron microscopy. Twin boundaries generated on the ribbon edge have been studied. Intersections of such a twin boundary with a microtwin or a stacking fault are identified as generation sites of two grain boundaries. Thermoelastic stresses arising during the growth process are also related to defect generation. In a region of significant stresses, many dislocations (dislocation clusters) are visible. Dislocation slip frequently is observed. Twin boundaries are real locks for such a slip." @default.
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- W2114643795 date "1987-03-01" @default.
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- W2114643795 title "A review of structural defect generation mechanisms in EFG ribbons" @default.
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- W2114643795 doi "https://doi.org/10.1016/0022-0248(87)90186-2" @default.
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