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- W2116731827 abstract "In this paper, we present a new built-in current sensor (BICS) for high speed, low voltage degradation transient current (IDDT) testing. This sensor has been designed using forward bias technique to limit the supply voltage degradation caused during transient current peaks to 2% of the supply voltage. A CMOS operational amplifier designed for operation at plusmn2.5 V in 0.5 mum n-well CMOS process is used as the circuit under test (CUT). The faults simulating possible short and bridging defects are introduced using the fault injection transistors (FIT). A total of twenty short faults have been introduced into the CUT and nineteen of them were detected, giving 95% fault coverage." @default.
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- W2116731827 date "2008-03-01" @default.
- W2116731827 modified "2023-09-26" @default.
- W2116731827 title "Built-in Current Sensor for High Speed Transient Current Testing in Analog CMOS Circuits" @default.
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- W2116731827 doi "https://doi.org/10.1109/ssst.2008.4480227" @default.
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