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• W2117103681 abstract "We have developed scanning near-field microwave microscopes which can image electrodynamic properties of superconducting materials on length scales down to about 2 /spl mu/m. The microscopes are capable of quantitative imaging of sheet resistance of thin films, and surface topography. We demonstrate the utility of the microscopes through images of the sheet resistance of a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film wafer, images of bulk Nb surfaces, and spatially resolved measurements of T/sub c/ of a YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin film. We also discuss some of the limitations of the microscope and conclude with a summary of its present capabilities." @default.
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• W2117103681 date "1999-06-01" @default.
• W2117103681 modified "2023-09-27" @default.
• W2117103681 title "Superconducting material diagnostics using a scanning near-field microwave microscope" @default.
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• W2117103681 doi "https://doi.org/10.1109/77.783934" @default.
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