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• W2118910735 abstract "Diagnosing multiple stuck-at faults in combinational circuits using singleand multiple-fault simulation is proposed. The proposed method adds (removes) faults from a set of suspected faults depending on the result of multiple-fault simulation at a primary output agreeing (disagreeing) with the observed value. However, the faults that are added or removed from the set of suspected faults are determined using single-fault simulation. Diagnosis is carried out by repeated addition and removal of faults. The effectiveness of the diagnosis method is evaluated by experiments conducted on benchmark circuits and it is found to be substantially superior compared to the previous known solutions. The method proposed in this paper can be used as a powerful tool at the preprocessing stage of diagnosis in an electron-beam tester environment." @default.
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• W2118910735 date "2002-03-01" @default.
• W2118910735 modified "2023-10-16" @default.
• W2118910735 title "On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits" @default.
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• W2118910735 doi "https://doi.org/10.1109/43.986429" @default.
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