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- W2119521940 abstract "Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophisticated methods are proposed for scan-test, there are not so many for logic BIST because of its uncontrollable randomness. However, logic BIST currently becomes vital for system debug or field test. This paper proposes a novel low power BIST technology that reduces shift-power by eliminating the specified high-frequency parts of vectors and also reduces capture power. The authors show that the proposed technology not only reduces test power but also keeps test coverage with little loss." @default.
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- W2119521940 date "2012-11-01" @default.
- W2119521940 modified "2023-10-14" @default.
- W2119521940 title "Low Power BIST for Scan-Shift and Capture Power" @default.
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- W2119521940 doi "https://doi.org/10.1109/ats.2012.27" @default.
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