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- W2122675550 abstract "This chapter addresses the motivation behind subjecting a VLSI design to delay testing. The need for delay testing can best be demonstrated by experimental data on real designs. Therefore, this chapter will focus on several case studies of delay testing conducted by research groups in industry and academia [12, 13, 21, 107, 108, 109, 147]." @default.
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- W2122675550 date "1998-01-01" @default.
- W2122675550 modified "2023-09-27" @default.
- W2122675550 title "Case Studies on Delay Testing" @default.
- W2122675550 doi "https://doi.org/10.1007/978-1-4615-5597-1_4" @default.
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