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- W2122869439 abstract "Nanodisperse silicon nitride powders were produced by different methods of synthesis. The effect of the production routes on the grain-size distribution and the dislocation density in the powders were studied by high-resolution X-ray diffraction. The average grain-size and the dislocation density of the samples were determined by the recently developed modified Williamson-Hall and Warren-Averbach procedures from X-ray diffraction profiles. A new numerical method provided log-normal grain-size distributions from the size parameters derived from X-ray diffraction profiles. It was established that the powder produced by silicon nitridation and milling had lower average grain-size and wider size distribution than the sample crystallized from amorphous silicon nitride powder synthesized in plasma reactor. The grain-size distribution and the area-weighted average grain-size obtained by X-rays were in good agreement with those determined by TEM and from the specific surface area, respectively. The dislocation density was found to be between 1014 and 1015m-2." @default.
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- W2122869439 date "2001-10-01" @default.
- W2122869439 modified "2023-10-17" @default.
- W2122869439 title "X-Ray Line Profile Analysis of Nanodisperse Silicon Nitride Ceramics" @default.
- W2122869439 doi "https://doi.org/10.4028/www.scientific.net/msf.378-381.729" @default.
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