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- W2123013452 abstract "We provide a definition of undetectable faults in partial scan circuits under a test application scheme where a test consists of primary input vectors applied at-speed between scan operations. We also provide sufficient conditions for a fault to be undetectable under this test application scheme. We present experimental results on finite-state machine benchmarks to demonstrate the effectiveness of these conditions in identifying undetectable faults." @default.
- W2123013452 created "2016-06-24" @default.
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- W2123013452 date "2002-01-01" @default.
- W2123013452 modified "2023-09-23" @default.
- W2123013452 title "On undetectable faults in partial scan circuits" @default.
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- W2123013452 doi "https://doi.org/10.1145/774572.774584" @default.
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