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- W2124016993 abstract "An experimental analysis of on-wafer S-parameter uncertainties is presented. Recently, two different approaches, based either on differential numerical programming or on a fully analytical solution, have been introduced. In order to establish their suitability, a careful comparison is given for on-wafer measurements. Through this comparison, possible limitations and causes of errors are also highlighted. Finally, the uncertainty evaluation of the 16-term error model is presented for the first time." @default.
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- W2124016993 date "2014-04-01" @default.
- W2124016993 modified "2023-09-27" @default.
- W2124016993 title "A Comparison of Uncertainty Evaluation Methods for On-Wafer $S$-Parameter Measurements" @default.
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- W2124016993 doi "https://doi.org/10.1109/tim.2013.2287796" @default.
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