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- W2124641884 abstract "In BiCMOS, transistor stuck-OPEN faults exhibit delay faults in addition to sequential behavior. Stuck-ON faults cause enhanced I/sub DDQ/. The faulty behavior of Bipolar (TTL) and CMOS logic families is compared with BiCMOS. The faults in BiCMOS devices cause one or more parts (p-part or n-parts) of the circuit to exhibit a different state (conducting or nonconducting) from the fault-free circuit. An input pattern classification scheme is presented for different faults. These classes of patterns are then used to obtain test sets. >" @default.
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- W2124641884 date "2002-12-17" @default.
- W2124641884 modified "2023-09-27" @default.
- W2124641884 title "Input pattern classification for transistor level testing of BiCMOS circuits" @default.
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- W2124641884 doi "https://doi.org/10.1109/vtest.1994.292273" @default.
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