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- W2124816398 abstract "Existing approaches to modeling mismatch effects in matching-critical circuits are based upon models derived under the widely accepted premise that distributed parameter devices can be modeled with lumped parameter models. It is shown in this paper that the lumped parameter models do not consistently reflect device performance and introduce substantial errors in matching-critical circuits if either systematic or random parameter variations occur in the channel." @default.
- W2124816398 created "2016-06-24" @default.
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- W2124816398 date "2002-11-11" @default.
- W2124816398 modified "2023-09-26" @default.
- W2124816398 title "Impact of model errors on predicting performance of matching-critical circuits" @default.
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- W2124816398 doi "https://doi.org/10.1109/mwscas.2000.951459" @default.
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