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- W2127115403 abstract "This paper introduces a simulator that allows analyzing the radiation induced errors on memory devices. The simulator takes all the radiation effects on SRAM into account and can be easily tuned on the base of data gained during radiation experiments and/or presented in literature. We also present a case study application in which the proposed simulator is used to validate a low-cost hardware platform for soft error detection in avionic environment by the mean of atmospheric balloons in the context of HAMLET project." @default.
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- W2127115403 date "2010-12-01" @default.
- W2127115403 modified "2023-10-18" @default.
- W2127115403 title "A Memory Fault Simulator for Radiation-Induced Effects in SRAMs" @default.
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- W2127115403 doi "https://doi.org/10.1109/ats.2010.26" @default.
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