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• W2127356388 abstract "Test technology development for processor-based Systems on a Chip (SoCs) has mainly focused on quality and cost of production test. More recently, test technologies that facilitate self test in the field of application are getting additional attention. Hardware-based built-in self test (BIST) is well understood for logic and for memory block, but can hardly cope with changing test strategies. We present a scalable test architecture based on a configurable test processor and a distributed modular scan controller that facilitates self test for logic and for bus structures and can optionally support externally controlled production test." @default.
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• W2127356388 date "2007-07-01" @default.
• W2127356388 modified "2023-10-01" @default.
• W2127356388 title "A Configurable Modular Test Processor and Scan Controller Architecture" @default.
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• W2127356388 doi "https://doi.org/10.1109/iolts.2007.6" @default.
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