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- W2130171897 abstract "The dependence of microstructure and magnetic properties of RF-sputtered thin films of Co-Ni-Pt deposited on NiP/Al and Cr/NiP/Al substrates was studied as a function of platinum composition, Ar pressure, and sputtering power. Transmission electron microscopy and electron and X-ray diffraction were utilized to determine the correlation between the observed coercivity, remanence squareness behavior, and microstructure. It has been found that in the case of films on NiP/Al substrates, the coercivity is controlled by the grain size, whereas it is dominated by the relative amount of the HCP and FCC cobalt phases for the films deposited on a 300-nm Cr underlayer. An increase in the Ar pressure leads to a further increase in coercivity for both substrates. This behavior was attributed to an increase in the grain size and a more favorable c-axis orientation of the HCP cobalt phase for Cr and NiP underlayers, respectively.< <ETX xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>></ETX>" @default.
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- W2130171897 date "1990-01-01" @default.
- W2130171897 modified "2023-10-13" @default.
- W2130171897 title "Microstructure and magnetic properties of thin-film Co-Ni-Pt for longitudinal recording" @default.
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- W2130171897 doi "https://doi.org/10.1109/20.104696" @default.
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