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- W2131004284 endingPage "2047" @default.
- W2131004284 startingPage "2040" @default.
- W2131004284 abstract "Identifying aging effects that impact radiation hardness of microelectronics is becoming increasingly important as military weapon systems are kept in the stockpile for times beyond their originally intended use period. In this work, burn-in effects are used to demonstrate the potential impact of thermally-activated aging effects on integrated circuit radiation hardness. Static random access memories (SRAMs) from three different commercial technologies were irradiated with different pre-irradiation stress conditions. A reduction in the total dose functional failure level was observed for SRAMs from two of the technologies subjected to pre-irradiation elevated temperature stresses. This is the first time the burn-in effect has been shown to degrade the radiation-induced functional failure level of an IC. SRAM data also show no indication that the burn-in effect will saturate, at least for the conditions examined in this work. These data indicate that long-term aging can result in more device degradation than is accounted for by present hardness assurance test guidelines, potentially causing device and/or system failure during the aging period. While only a few technologies have been examined to date, we suspect other technologies may exhibit similar long-term aging effects. Technique for including aging effects within a hardness assurance test program is outlined." @default.
- W2131004284 created "2016-06-24" @default.
- W2131004284 creator A5009820171 @default.
- W2131004284 creator A5010472455 @default.
- W2131004284 creator A5011631892 @default.
- W2131004284 creator A5024133729 @default.
- W2131004284 creator A5024798593 @default.
- W2131004284 creator A5049822123 @default.
- W2131004284 creator A5062136534 @default.
- W2131004284 date "1997-12-01" @default.
- W2131004284 modified "2023-09-26" @default.
- W2131004284 title "Impact of aging on radiation hardness[CMOS SRAMs]" @default.
- W2131004284 cites W1972005006 @default.
- W2131004284 cites W1974315869 @default.
- W2131004284 cites W1998804339 @default.
- W2131004284 cites W2007297276 @default.
- W2131004284 cites W2021007263 @default.
- W2131004284 cites W2021068375 @default.
- W2131004284 cites W2049935257 @default.
- W2131004284 cites W2071395185 @default.
- W2131004284 cites W2081594469 @default.
- W2131004284 cites W2082931062 @default.
- W2131004284 cites W2087450899 @default.
- W2131004284 cites W2098356066 @default.
- W2131004284 cites W2115343518 @default.
- W2131004284 cites W2148657785 @default.
- W2131004284 cites W2158390909 @default.
- W2131004284 cites W4251277452 @default.
- W2131004284 doi "https://doi.org/10.1109/23.658987" @default.
- W2131004284 hasPublicationYear "1997" @default.
- W2131004284 type Work @default.
- W2131004284 sameAs 2131004284 @default.
- W2131004284 citedByCount "28" @default.
- W2131004284 countsByYear W21310042842013 @default.
- W2131004284 countsByYear W21310042842018 @default.
- W2131004284 countsByYear W21310042842021 @default.
- W2131004284 countsByYear W21310042842022 @default.
- W2131004284 countsByYear W21310042842023 @default.
- W2131004284 crossrefType "journal-article" @default.
- W2131004284 hasAuthorship W2131004284A5009820171 @default.
- W2131004284 hasAuthorship W2131004284A5010472455 @default.
- W2131004284 hasAuthorship W2131004284A5011631892 @default.
- W2131004284 hasAuthorship W2131004284A5024133729 @default.
- W2131004284 hasAuthorship W2131004284A5024798593 @default.
- W2131004284 hasAuthorship W2131004284A5049822123 @default.
- W2131004284 hasAuthorship W2131004284A5062136534 @default.
- W2131004284 hasConcept C111337013 @default.
- W2131004284 hasConcept C116915560 @default.
- W2131004284 hasConcept C119349744 @default.
- W2131004284 hasConcept C119599485 @default.
- W2131004284 hasConcept C121332964 @default.
- W2131004284 hasConcept C127413603 @default.
- W2131004284 hasConcept C179707776 @default.
- W2131004284 hasConcept C185544564 @default.
- W2131004284 hasConcept C187937830 @default.
- W2131004284 hasConcept C192562407 @default.
- W2131004284 hasConcept C200601418 @default.
- W2131004284 hasConcept C2781425195 @default.
- W2131004284 hasConcept C46362747 @default.
- W2131004284 hasConcept C49040817 @default.
- W2131004284 hasConcept C68043766 @default.
- W2131004284 hasConceptScore W2131004284C111337013 @default.
- W2131004284 hasConceptScore W2131004284C116915560 @default.
- W2131004284 hasConceptScore W2131004284C119349744 @default.
- W2131004284 hasConceptScore W2131004284C119599485 @default.
- W2131004284 hasConceptScore W2131004284C121332964 @default.
- W2131004284 hasConceptScore W2131004284C127413603 @default.
- W2131004284 hasConceptScore W2131004284C179707776 @default.
- W2131004284 hasConceptScore W2131004284C185544564 @default.
- W2131004284 hasConceptScore W2131004284C187937830 @default.
- W2131004284 hasConceptScore W2131004284C192562407 @default.
- W2131004284 hasConceptScore W2131004284C200601418 @default.
- W2131004284 hasConceptScore W2131004284C2781425195 @default.
- W2131004284 hasConceptScore W2131004284C46362747 @default.
- W2131004284 hasConceptScore W2131004284C49040817 @default.
- W2131004284 hasConceptScore W2131004284C68043766 @default.
- W2131004284 hasIssue "6" @default.
- W2131004284 hasLocation W21310042841 @default.
- W2131004284 hasOpenAccess W2131004284 @default.
- W2131004284 hasPrimaryLocation W21310042841 @default.
- W2131004284 hasRelatedWork W1489365633 @default.
- W2131004284 hasRelatedWork W2017748633 @default.
- W2131004284 hasRelatedWork W2098014430 @default.
- W2131004284 hasRelatedWork W2125832201 @default.
- W2131004284 hasRelatedWork W2126879644 @default.
- W2131004284 hasRelatedWork W2131004284 @default.
- W2131004284 hasRelatedWork W2131303554 @default.
- W2131004284 hasRelatedWork W2315752188 @default.
- W2131004284 hasRelatedWork W2542785981 @default.
- W2131004284 hasRelatedWork W2986331286 @default.
- W2131004284 hasVolume "44" @default.
- W2131004284 isParatext "false" @default.
- W2131004284 isRetracted "false" @default.
- W2131004284 magId "2131004284" @default.
- W2131004284 workType "article" @default.