Matches in SemOpenAlex for { <https://semopenalex.org/work/W2131987022> ?p ?o ?g. }
- W2131987022 endingPage "226" @default.
- W2131987022 startingPage "219" @default.
- W2131987022 abstract "The negative bias temperature instability (NBTI) is, arguably, the single most important reliability problem in present day metal-oxide-silicon field-effect transistor (MOSFET) technology. This paper presents a model for the NBTI which is radically different from the quite widely utilized reaction diffusion models which dominate the current day NBTI literature. The proposed model is relevant to technologically important nitrided oxide pMOSFETs. The model is clearly not, at least in its entirety, relevant to pure silicon dioxide gate pMOSFETs. The reaction diffusion models involve hydrogen/silicon bond breaking events at the silicon/silicon dioxide interface initiated by the presence of an interface hole, followed by the diffusion of a hydrogenic species from the interface as well as the potential rebonding of hydrogen and interface trap defect centers. This model does not invoke hydrogen in any form whatsoever but does simply account for the observed NBTI power law response with a reasonable, at least very plausible, assumption about defect distribution and provides a reasonably accurate value for this exponent. (Without making any assumption about defect distribution, the model still provides a time response semiquantitatively consistent with the observations, reasonable agreement considering the simplifying assumptions in the calculations.) The model also provides a reasonable explanation for the recovery which includes a simple explanation for the extremely rapid rate of recovery at short times. In addition, the model provides a very simple explanation why the introduction of nitrogen greatly enhances the NBTI. The model, as presented in this paper, should be viewed as a first-order approximation; it contains several simplifying assumptions. Finally, the model is consistent with recent electron paramagnetic resonance studies of NBTI defect chemistry in nitrided oxide pMOSFETs." @default.
- W2131987022 created "2016-06-24" @default.
- W2131987022 creator A5011597387 @default.
- W2131987022 creator A5032818658 @default.
- W2131987022 creator A5047673170 @default.
- W2131987022 creator A5079177496 @default.
- W2131987022 date "2011-06-01" @default.
- W2131987022 modified "2023-09-23" @default.
- W2131987022 title "A Model for NBTI in Nitrided Oxide MOSFETs Which Does Not Involve Hydrogen or Diffusion" @default.
- W2131987022 cites W1965320712 @default.
- W2131987022 cites W1970029119 @default.
- W2131987022 cites W1972289215 @default.
- W2131987022 cites W1983004947 @default.
- W2131987022 cites W1985340182 @default.
- W2131987022 cites W1990804858 @default.
- W2131987022 cites W1991782916 @default.
- W2131987022 cites W2001349833 @default.
- W2131987022 cites W2002764074 @default.
- W2131987022 cites W2012364451 @default.
- W2131987022 cites W2012574960 @default.
- W2131987022 cites W2035338135 @default.
- W2131987022 cites W2041663197 @default.
- W2131987022 cites W2042862544 @default.
- W2131987022 cites W2044435263 @default.
- W2131987022 cites W2044768755 @default.
- W2131987022 cites W2047378842 @default.
- W2131987022 cites W2050632774 @default.
- W2131987022 cites W2073274025 @default.
- W2131987022 cites W2073794551 @default.
- W2131987022 cites W2084678614 @default.
- W2131987022 cites W2085289999 @default.
- W2131987022 cites W2133306422 @default.
- W2131987022 cites W2140423040 @default.
- W2131987022 cites W2151512997 @default.
- W2131987022 cites W2156601616 @default.
- W2131987022 cites W2170109091 @default.
- W2131987022 cites W2171853149 @default.
- W2131987022 cites W3165396612 @default.
- W2131987022 doi "https://doi.org/10.1109/tdmr.2010.2063031" @default.
- W2131987022 hasPublicationYear "2011" @default.
- W2131987022 type Work @default.
- W2131987022 sameAs 2131987022 @default.
- W2131987022 citedByCount "21" @default.
- W2131987022 countsByYear W21319870222012 @default.
- W2131987022 countsByYear W21319870222013 @default.
- W2131987022 countsByYear W21319870222014 @default.
- W2131987022 countsByYear W21319870222015 @default.
- W2131987022 countsByYear W21319870222016 @default.
- W2131987022 countsByYear W21319870222017 @default.
- W2131987022 countsByYear W21319870222018 @default.
- W2131987022 countsByYear W21319870222019 @default.
- W2131987022 countsByYear W21319870222020 @default.
- W2131987022 crossrefType "journal-article" @default.
- W2131987022 hasAuthorship W2131987022A5011597387 @default.
- W2131987022 hasAuthorship W2131987022A5032818658 @default.
- W2131987022 hasAuthorship W2131987022A5047673170 @default.
- W2131987022 hasAuthorship W2131987022A5079177496 @default.
- W2131987022 hasConcept C119599485 @default.
- W2131987022 hasConcept C121332964 @default.
- W2131987022 hasConcept C127413603 @default.
- W2131987022 hasConcept C13862629 @default.
- W2131987022 hasConcept C165801399 @default.
- W2131987022 hasConcept C171250308 @default.
- W2131987022 hasConcept C172385210 @default.
- W2131987022 hasConcept C178790620 @default.
- W2131987022 hasConcept C185592680 @default.
- W2131987022 hasConcept C191897082 @default.
- W2131987022 hasConcept C192562407 @default.
- W2131987022 hasConcept C200601418 @default.
- W2131987022 hasConcept C24326235 @default.
- W2131987022 hasConcept C2778413303 @default.
- W2131987022 hasConcept C2779227376 @default.
- W2131987022 hasConcept C2779851234 @default.
- W2131987022 hasConcept C49040817 @default.
- W2131987022 hasConcept C512968161 @default.
- W2131987022 hasConcept C557185 @default.
- W2131987022 hasConcept C61696701 @default.
- W2131987022 hasConcept C69357855 @default.
- W2131987022 hasConcept C97355855 @default.
- W2131987022 hasConceptScore W2131987022C119599485 @default.
- W2131987022 hasConceptScore W2131987022C121332964 @default.
- W2131987022 hasConceptScore W2131987022C127413603 @default.
- W2131987022 hasConceptScore W2131987022C13862629 @default.
- W2131987022 hasConceptScore W2131987022C165801399 @default.
- W2131987022 hasConceptScore W2131987022C171250308 @default.
- W2131987022 hasConceptScore W2131987022C172385210 @default.
- W2131987022 hasConceptScore W2131987022C178790620 @default.
- W2131987022 hasConceptScore W2131987022C185592680 @default.
- W2131987022 hasConceptScore W2131987022C191897082 @default.
- W2131987022 hasConceptScore W2131987022C192562407 @default.
- W2131987022 hasConceptScore W2131987022C200601418 @default.
- W2131987022 hasConceptScore W2131987022C24326235 @default.
- W2131987022 hasConceptScore W2131987022C2778413303 @default.
- W2131987022 hasConceptScore W2131987022C2779227376 @default.
- W2131987022 hasConceptScore W2131987022C2779851234 @default.
- W2131987022 hasConceptScore W2131987022C49040817 @default.
- W2131987022 hasConceptScore W2131987022C512968161 @default.
- W2131987022 hasConceptScore W2131987022C557185 @default.