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• W2133406150 abstract "The scaling trend of semiconductor devices has raised several issues such as energy consumption and heat dissipation, as well as the increasing probabilistic behavior of devices. Motivated by the necessity to consider probabilistic approaches to future designs, probabilistic CMOS (PCMOS) based computing has been proposed. PCMOS devices are inherently probabilistic devices that compute correctly with a probability <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> . This paper investigates the tradeoffs between the energy, speed (or performance), and probability of correctness ( <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> ) of PCMOS circuits. For given constraints on <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> , performance, and energy delay product (EDP), and using analytical models of energy, delay, and <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> , the optimum values of EDP and probability are found for PCMOS circuits. The analytical models are validated using circuit simulations for PCMOS circuits designed in a 0.13-mum process. The results show that, to minimize EDP, it is preferable to operate PCMOS circuits at lower supply voltages. On the other hand, to maximize <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> , the highest possible supply voltage under the given constraints is preferable. Our analysis makes it possible to achieve an optimal circuit design that satisfies the <i xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>p</i> , performance, and EDP requirements for a given application. An analysis of the impact of variations in temperature, threshold voltage, and supply voltage on optimal EDP and probability values is also included." @default.
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• W2133406150 date "2008-09-01" @default.
• W2133406150 modified "2023-10-17" @default.
• W2133406150 title "Energy, Performance, and Probability Tradeoffs for Energy-Efficient Probabilistic CMOS Circuits" @default.
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• W2133406150 doi "https://doi.org/10.1109/tcsi.2008.920139" @default.
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