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• W2134132903 abstract "Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one of the most important reliability concerns for deep nano-scale regime VLSI circuits. Hence, aging-resilient design methodologies are necessary to address this issue in order to improve reliability, preferably with minimal impact on the area, power and performance. This work offers two major contributions to the aging-resilient circuit design methodology literature. First, it introduces a novel sensor circuit that can detect the aging of pipeline architectures by monitoring the arrival time of data signals at flip-flops. The area overhead of the proposed circuit is estimated to be less than 45% compared to that of previous approaches, which are over 95%. To ensure the accuracy of its operation, a comprehensive timing analysis is performed on the proposed circuit including the influence of process variations. As a second contribution, this work presents an innovative correction technique to reduce the probability of timing failures caused by aging. This method employs novel reconfigurable flip-flops, which operate as normal flip-flops as long as the circuit is fresh, but function as time-borrowing flip-flops once the circuit ages. This unique flip-flop design allows utilization of the advantages of the time-borrowing technique while avoiding potential race conditions that can be created by employing such a technique. It is shown via simulations that by employing the proposed design methodology, the probability of timing failures in the aged circuits can be reduced by as much as 10X for various benchmark circuits." @default.
• W2134132903 created "2016-06-24" @default.
• W2134132903 creator A5075851236 @default.
• W2134132903 creator A5087580039 @default.
• W2134132903 date "2010-03-08" @default.
• W2134132903 modified "2023-09-29" @default.
• W2134132903 title "Aging-resilient design of pipelined architectures using novel detection and correction circuits" @default.
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• W2134132903 doi "https://doi.org/10.5555/1870926.1870984" @default.
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