Matches in SemOpenAlex for { <https://semopenalex.org/work/W2134749596> ?p ?o ?g. }
Showing items 1 to 86 of
86
with 100 items per page.
- W2134749596 abstract "The challenge of electrostatic discharge (ESD) design is that as scaling continues and operating voltages are lowered, the interface to the outside world and therefore the ESD specifications remain the same. Moreover, as has been highlighted by Duvvury et al. (1996), the first breakdown voltage for snapback of a transistor and the median breakdown voltage of the gate dielectric are converging, making it difficult to ensure the robustness of gate dielectrics in an ESD event. This is particularly true for 1V I/O's in high-speed, high-performance applications, where transistor gates may be directly connected to an external pin or NFETs may be used as compact decoupling capacitors between VDD and VSS, exposing the thin gate dielectric to ESD stress. The ESD protection and interconnects can both contribute voltage drops during an ESD pulse, and their sum must not be higher than the voltage which a dielectric can withstand. Especially alarming is the fact that in the sub-2nm regime, significant statistical variation exists as well as a dependence on area for dielectric breakdown. A vast knowledge base exists for oxide breakdown in the long time-scale, and a few publications have addressed short time-scales. For the most part, studies which described breakdowns at short times have used methodology developed for thicker oxides. In the case of thinner oxides or oxynitrides, the voltage acceleration is no longer 1/E, the dielectric breakdown voltage depends sensitively on the dielectric area, and small differences in thickness have a significant effect on the dielectric breakdown voltage. Therefore, the purpose of this paper is to study the relevance of long time-scale TDDB data in predicting the response to short time-scale ESD events, especially for sub-2nm dielectrics in both NFETS and PFETS." @default.
- W2134749596 created "2016-06-24" @default.
- W2134749596 creator A5039412437 @default.
- W2134749596 creator A5046217654 @default.
- W2134749596 creator A5057532371 @default.
- W2134749596 creator A5073548957 @default.
- W2134749596 date "2004-08-13" @default.
- W2134749596 modified "2023-09-24" @default.
- W2134749596 title "Gate dielectric breakdown: A focus on ESD protection" @default.
- W2134749596 cites W1589467559 @default.
- W2134749596 cites W1964180067 @default.
- W2134749596 cites W1980976383 @default.
- W2134749596 cites W2007757449 @default.
- W2134749596 cites W2029437716 @default.
- W2134749596 cites W2048485854 @default.
- W2134749596 cites W2059536080 @default.
- W2134749596 cites W2074397055 @default.
- W2134749596 cites W2107788624 @default.
- W2134749596 doi "https://doi.org/10.1109/relphy.2004.1315359" @default.
- W2134749596 hasPublicationYear "2004" @default.
- W2134749596 type Work @default.
- W2134749596 sameAs 2134749596 @default.
- W2134749596 citedByCount "17" @default.
- W2134749596 countsByYear W21347495962018 @default.
- W2134749596 crossrefType "proceedings-article" @default.
- W2134749596 hasAuthorship W2134749596A5039412437 @default.
- W2134749596 hasAuthorship W2134749596A5046217654 @default.
- W2134749596 hasAuthorship W2134749596A5057532371 @default.
- W2134749596 hasAuthorship W2134749596A5073548957 @default.
- W2134749596 hasConcept C119321828 @default.
- W2134749596 hasConcept C119599485 @default.
- W2134749596 hasConcept C127413603 @default.
- W2134749596 hasConcept C133386390 @default.
- W2134749596 hasConcept C133731056 @default.
- W2134749596 hasConcept C152909973 @default.
- W2134749596 hasConcept C16317505 @default.
- W2134749596 hasConcept C165801399 @default.
- W2134749596 hasConcept C166972891 @default.
- W2134749596 hasConcept C172385210 @default.
- W2134749596 hasConcept C192562407 @default.
- W2134749596 hasConcept C195370968 @default.
- W2134749596 hasConcept C205483674 @default.
- W2134749596 hasConcept C205606062 @default.
- W2134749596 hasConcept C2361726 @default.
- W2134749596 hasConcept C2779888857 @default.
- W2134749596 hasConcept C49040817 @default.
- W2134749596 hasConcept C52192207 @default.
- W2134749596 hasConcept C70401718 @default.
- W2134749596 hasConcept C88182573 @default.
- W2134749596 hasConceptScore W2134749596C119321828 @default.
- W2134749596 hasConceptScore W2134749596C119599485 @default.
- W2134749596 hasConceptScore W2134749596C127413603 @default.
- W2134749596 hasConceptScore W2134749596C133386390 @default.
- W2134749596 hasConceptScore W2134749596C133731056 @default.
- W2134749596 hasConceptScore W2134749596C152909973 @default.
- W2134749596 hasConceptScore W2134749596C16317505 @default.
- W2134749596 hasConceptScore W2134749596C165801399 @default.
- W2134749596 hasConceptScore W2134749596C166972891 @default.
- W2134749596 hasConceptScore W2134749596C172385210 @default.
- W2134749596 hasConceptScore W2134749596C192562407 @default.
- W2134749596 hasConceptScore W2134749596C195370968 @default.
- W2134749596 hasConceptScore W2134749596C205483674 @default.
- W2134749596 hasConceptScore W2134749596C205606062 @default.
- W2134749596 hasConceptScore W2134749596C2361726 @default.
- W2134749596 hasConceptScore W2134749596C2779888857 @default.
- W2134749596 hasConceptScore W2134749596C49040817 @default.
- W2134749596 hasConceptScore W2134749596C52192207 @default.
- W2134749596 hasConceptScore W2134749596C70401718 @default.
- W2134749596 hasConceptScore W2134749596C88182573 @default.
- W2134749596 hasLocation W21347495961 @default.
- W2134749596 hasOpenAccess W2134749596 @default.
- W2134749596 hasPrimaryLocation W21347495961 @default.
- W2134749596 hasRelatedWork W1535762089 @default.
- W2134749596 hasRelatedWork W1833138979 @default.
- W2134749596 hasRelatedWork W2023709589 @default.
- W2134749596 hasRelatedWork W2038263698 @default.
- W2134749596 hasRelatedWork W2065583541 @default.
- W2134749596 hasRelatedWork W2078428635 @default.
- W2134749596 hasRelatedWork W2134749596 @default.
- W2134749596 hasRelatedWork W2177600850 @default.
- W2134749596 hasRelatedWork W2243340867 @default.
- W2134749596 hasRelatedWork W2903976092 @default.
- W2134749596 isParatext "false" @default.
- W2134749596 isRetracted "false" @default.
- W2134749596 magId "2134749596" @default.
- W2134749596 workType "article" @default.