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• W2134799282 abstract "Laser-based shock experiments have been conducted in thin Si and Cu crystals at pressures above the published Hugoniot Elastic Limit (HEL) for these materials. In situ x-ray diffraction has been used to directly measure the response of the shocked lattice during shock loading. Static film and x-ray streak cameras recorded x rays diffracted from lattice planes both parallel and perpendicular to the shock direction. In addition, experiments were conducted using a wide-angle detector to record x rays diffracted from multiple lattice planes simultaneously. These data showed uniaxial compression of Si (100) along the shock direction and three-dimensional compression of Cu (100). In the case of the Si diffraction, there was a multiple wave structure observed. This is evaluated to determine whether there is a phase transition occurring on the time scale of the experiments, or the HEL is much higher than previously reported. Results of the measurements are presented." @default.
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• W2134799282 date "2003-04-22" @default.
• W2134799282 modified "2023-10-14" @default.
• W2134799282 title "High-pressure, high-strain-rate lattice response of shocked materials" @default.
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• W2134799282 doi "https://doi.org/10.1063/1.1565118" @default.
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