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- W2134984689 abstract "Modulation transfer function (MTF) metrology and interpretation for digital image capture devices has usually concentrated on mid- to high-frequency information, relative to the half-sampling frequency. These regions typically quantify characteristics and operations such as sharpening, limiting resolution, and aliasing. However, a potential wealth of low-frequency, visually significant information is often masked in existing measurement results because of spatial data truncation. For print or document scanners, this influences measurements in the spatial frequency range of 0 to 2.0 cycles/mm, where the effects of veiling flare, micro flare, and integrating cavity effect (ICE) often manifest themselves. Using a form of edge-gradient analysis based on slanted edges, we present a method for measurement of these characteristics. By carefully adapting this well-established technique, these phenomena can be quantified. We also show how, in many cases, these effects can be treated as other spread-function or device-MTF components. The theory and field metrology of several devices using the adapted technique are also presented." @default.
- W2134984689 created "2016-06-24" @default.
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- W2134984689 date "2003-12-19" @default.
- W2134984689 modified "2023-09-23" @default.
- W2134984689 title "<title>Low-frequency MTF estimation for digital imaging devices using slanted-edge analysis</title>" @default.
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- W2134984689 doi "https://doi.org/10.1117/12.532405" @default.
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