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• W2135000415 abstract "In this paper, a new emission-based method for measuring the amplitude of on-chip power supply noise is presented. This technique uses Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC) from CMOS gates, which are used as local probe points for the noise. In order to demonstrate the capabilities of this technique, we discuss the results obtained for two early microprocessor chips fabricated in 65 nm and 45 nm Silicon On Insulator (SOI) technologies." @default.
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• W2135000415 date "2009-11-01" @default.
• W2135000415 modified "2023-09-26" @default.
• W2135000415 title "On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)" @default.
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• W2135000415 doi "https://doi.org/10.1109/test.2009.5355543" @default.
• W2135000415 hasPublicationYear "2009" @default.
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