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- W2135703337 abstract "Radiation hardness is one of the most important characteristics in a space-borne instrument, particularly imaging devices. The charge-coupled device (CCD) is now used in the X-ray region. A structure inside the CCD is widely employed to make it radiation hard. Using a proton beam, we confirmed that the notch structure improved the charge transfer inefficiency (CTI) by a factor of three. We applied a mesh technique in the proton beam experiment of a CCD. The proton beam energy is 600 keV, which induces greater damage than do the beam of high energy widely reported. The CCD employed has 1024 /spl times/ 1024 pixels with a notch structure. The mesh technique enables us to confine the proton beam to a circular region of 2 /spl mu/m diameter within a 24/spl times/24 /spl mu/m/sup 2/ pixel. The CCD was kept at -100/spl deg/C during the irradiation. Some pixels are damaged in the notch region while others in the out-of-notch region. After the proton irradiation, we measured the CTI using 2/spl times/10/sup 7/ X-ray photons from /sup 55/Fe, and found that the CTI of pixels damaged in the notch region is larger by a factor of 2.5 than that of pixels damaged in the out-of-notch region. It is still in open question as to whether pixels damaged in the out-of-notch region show a substantial radiation damage effect." @default.
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- W2135703337 date "2004-10-01" @default.
- W2135703337 modified "2023-09-27" @default.
- W2135703337 title "Application of a mesh experiment for a proton beam onto the charge-coupled device" @default.
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- W2135703337 doi "https://doi.org/10.1109/tns.2004.835571" @default.
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