Matches in SemOpenAlex for { <https://semopenalex.org/work/W2137224514> ?p ?o ?g. }
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- W2137224514 endingPage "602" @default.
- W2137224514 startingPage "597" @default.
- W2137224514 abstract "Negative Bias Temperature Instability (NBTI) has emerged as the dominant PMOS device failure mechanism in the nanometer VLSI era. The extent of NBTI degradation of a PMOS device increases dramatically at elevated operating temperature and supply voltage. Unfortunately, both these conditions are concurrently experienced by a VLSI chip during the process of burn-in testing. Our analysis shows that even with a short burn-in duration of 10 hours, the degradation accumulated can be as much as 60% of the NBTI degradation experienced over 10 years of use at nominal conditions. Static burn-in testing in particular is observed to cause most NBTI degradation due to absence of relaxation phase unlike the case for dynamic burn-in testing. The delay of benchmark circuits is observed to increase by over 10% due to static burn-in testing. We propose the first technique to reduce the NBTI degradation during static burn-in test by finding the minimum NBTI induced delay degradation vector (MDDV) based on timing criticality and threshold voltage change (ΔV TH ) sensitivity of the cells. Further, only a subset of the input pins need to be controlled for NBTI reduction, thus our technique allows other objectives (such as leakage reduction) to be considered simultaneously. Experimental results show that the NBTI induced critical path delay degradation can be reduced by more than 50% using our proposed technique." @default.
- W2137224514 created "2016-06-24" @default.
- W2137224514 creator A5011883763 @default.
- W2137224514 creator A5070120135 @default.
- W2137224514 date "2011-01-25" @default.
- W2137224514 modified "2023-09-22" @default.
- W2137224514 title "Controlling NBTI degradation during static burn-in testing" @default.
- W2137224514 cites W1605203071 @default.
- W2137224514 cites W1991431227 @default.
- W2137224514 cites W1991891926 @default.
- W2137224514 cites W1999919743 @default.
- W2137224514 cites W2044178726 @default.
- W2137224514 cites W2071691160 @default.
- W2137224514 cites W2102729267 @default.
- W2137224514 cites W2113115586 @default.
- W2137224514 cites W2121367655 @default.
- W2137224514 cites W2122757690 @default.
- W2137224514 cites W2132463129 @default.
- W2137224514 cites W2135966495 @default.
- W2137224514 cites W2139071021 @default.
- W2137224514 cites W2139370583 @default.
- W2137224514 cites W2144702307 @default.
- W2137224514 cites W2155309348 @default.
- W2137224514 cites W2164178706 @default.
- W2137224514 cites W2180536720 @default.
- W2137224514 doi "https://doi.org/10.5555/1950815.1950934" @default.
- W2137224514 hasPublicationYear "2011" @default.
- W2137224514 type Work @default.
- W2137224514 sameAs 2137224514 @default.
- W2137224514 citedByCount "3" @default.
- W2137224514 countsByYear W21372245142015 @default.
- W2137224514 countsByYear W21372245142016 @default.
- W2137224514 countsByYear W21372245142017 @default.
- W2137224514 crossrefType "proceedings-article" @default.
- W2137224514 hasAuthorship W2137224514A5011883763 @default.
- W2137224514 hasAuthorship W2137224514A5070120135 @default.
- W2137224514 hasConcept C119599485 @default.
- W2137224514 hasConcept C127413603 @default.
- W2137224514 hasConcept C165801399 @default.
- W2137224514 hasConcept C172385210 @default.
- W2137224514 hasConcept C192562407 @default.
- W2137224514 hasConcept C195370968 @default.
- W2137224514 hasConcept C200601418 @default.
- W2137224514 hasConcept C24326235 @default.
- W2137224514 hasConcept C27050352 @default.
- W2137224514 hasConcept C2779679103 @default.
- W2137224514 hasConcept C557185 @default.
- W2137224514 hasConceptScore W2137224514C119599485 @default.
- W2137224514 hasConceptScore W2137224514C127413603 @default.
- W2137224514 hasConceptScore W2137224514C165801399 @default.
- W2137224514 hasConceptScore W2137224514C172385210 @default.
- W2137224514 hasConceptScore W2137224514C192562407 @default.
- W2137224514 hasConceptScore W2137224514C195370968 @default.
- W2137224514 hasConceptScore W2137224514C200601418 @default.
- W2137224514 hasConceptScore W2137224514C24326235 @default.
- W2137224514 hasConceptScore W2137224514C27050352 @default.
- W2137224514 hasConceptScore W2137224514C2779679103 @default.
- W2137224514 hasConceptScore W2137224514C557185 @default.
- W2137224514 hasLocation W21372245141 @default.
- W2137224514 hasOpenAccess W2137224514 @default.
- W2137224514 hasPrimaryLocation W21372245141 @default.
- W2137224514 hasRelatedWork W2004381967 @default.
- W2137224514 hasRelatedWork W2015053413 @default.
- W2137224514 hasRelatedWork W2046094701 @default.
- W2137224514 hasRelatedWork W2060311166 @default.
- W2137224514 hasRelatedWork W2068470721 @default.
- W2137224514 hasRelatedWork W2074507667 @default.
- W2137224514 hasRelatedWork W2096191509 @default.
- W2137224514 hasRelatedWork W2108852347 @default.
- W2137224514 hasRelatedWork W2113094253 @default.
- W2137224514 hasRelatedWork W2124563469 @default.
- W2137224514 hasRelatedWork W2130849137 @default.
- W2137224514 hasRelatedWork W2141607381 @default.
- W2137224514 hasRelatedWork W2142908374 @default.
- W2137224514 hasRelatedWork W2148282552 @default.
- W2137224514 hasRelatedWork W2268167631 @default.
- W2137224514 hasRelatedWork W2524699596 @default.
- W2137224514 hasRelatedWork W2604429372 @default.
- W2137224514 hasRelatedWork W2921164949 @default.
- W2137224514 hasRelatedWork W36274117 @default.
- W2137224514 hasRelatedWork W1591700396 @default.
- W2137224514 isParatext "false" @default.
- W2137224514 isRetracted "false" @default.
- W2137224514 magId "2137224514" @default.
- W2137224514 workType "article" @default.