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- W2137366465 abstract "Process variability has become a critical issue in scaled CMOS design. This article provides a comprehensive view on the predominant variation sources in sub-90-nm devices, their impact on device and circuit performance, and various modeling approaches for statistical circuit analysis." @default.
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- W2137366465 date "2010-03-01" @default.
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- W2137366465 title "Modeling Process Variability in Scaled CMOS Technology" @default.
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- W2137366465 doi "https://doi.org/10.1109/mdt.2010.50" @default.
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