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• W2137766167 abstract "Pulsed-force-mode atomic force microscopy (PFM-AFM) was used to map the adhesion force between an AFM tip and samples prepared by microcontact printing (μCP) and electrochemically generated ω-substituted alkanethiol monolayer gradients. AFM tips chemically derivatized to terminate with either -CH 3 or -COOH end functional groups were used to measure the adhesion foree difference between CH 3 - and COOH-terminated regions on a μCP sample in both air and deionized H 2 O. Images acquired in air with a CH 3 -terminated tip yielded mean adhesion force differences between CH 3 - and COOH-terminated sample regions, |ΔF|, of 7.5 ± 4.8 nN for tips prepared from alkanethiols on Au and 11.1 ± 3.0 nN for tips prepared from alkylsiloxanes on Si. The variability in |ΔF| was significantly reduced in deionized H 2 O. PFM-AFM was also able to distinguish CH 3 - and COOH-terminated regions in an electrochemically generated gradient in air and deionized H 2 O. The contrast of the image and adhesion force differences measured on electrochemically generated gradients in H 2 O were comparable to those measured on μCP samples. PFM-AFM images of electrochemically generated gradients indicated a transition region 75 mV wide in rough correspondence to the 60 mV width of the Fermi-Dirac distribution at 300 K." @default.
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• W2137766167 date "2002-01-01" @default.
• W2137766167 modified "2023-09-23" @default.
• W2137766167 title "Chemically Selective Force Mapping of Electrochemically Generated Two-Component ω-Substituted Alkanethiol Monolayer Gradients by Pulsed-Force-Mode Atomic Force Microscopy" @default.
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• W2137766167 doi "https://doi.org/10.1149/1.1499965" @default.
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