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- W2138216765 abstract "Parasitic effects induced by current switching in power lines for full wafer packages (monolithic or hybrid) are analyzed in the time domain. Theoretical results yield simple relations for easily predicting the dynamic voltage drop on the power line and the parasitic voltages on signal lines induced by coupling with the power line. Experimental measurements on typical devices validate these formulas. The analysis makes it possible to develop optimization criteria for the full wafer interconnect layout or other advanced packages (multichip carriers). >" @default.
- W2138216765 created "2016-06-24" @default.
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- W2138216765 date "2003-01-13" @default.
- W2138216765 modified "2023-09-25" @default.
- W2138216765 title "Parasitic effects induced by power strips current switching in full wafer package" @default.
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- W2138216765 doi "https://doi.org/10.1109/mwsym.1989.38955" @default.
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