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• W2140142016 abstract "Mechanisms for dose-rate dependent effects of ionizing radiation are described. Bimolecular mechanisms are shown to produce reduced effects at high dose rates. Calculations using such mechanisms are shown to produce good agreement with data from devices affected by enhanced low dose-rate sensitivity (ELDRS)." @default.
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• W2140142016 date "2008-12-01" @default.
• W2140142016 modified "2023-10-01" @default.
• W2140142016 title "Calculations of Radiation Dose-Rate Sensitivity of Bipolar Transistors" @default.
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• W2140142016 doi "https://doi.org/10.1109/tns.2008.2007487" @default.
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