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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2140542591> ?p ?o ?g. }

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• W2140542591 abstract "This paper discusses issues concerning single-event burnout (SEB) and single-event gate rupture (SEGR); explains and provides a basic overview of the preferred test conditions and procedures that would yield the most meaningful test results in evaluating power MOSFETs' SEB susceptibilities, describes how to correctly identify SEB and SEGR failure modes to derive the most feasible failure mechanisms." @default.
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• W2140542591 date "2008-12-01" @default.
• W2140542591 modified "2023-09-27" @default.
• W2140542591 title "Recommended Test Conditions for SEB Evaluation of Planar Power DMOSFETs" @default.
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• W2140542591 doi "https://doi.org/10.1109/tns.2008.2006841" @default.
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