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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2141528506> ?p ?o ?g. }

• W2141528506 abstract "An automatic test pattern generation program (ATPG) is described for large, application-specific integrated circuits (ASICs) designed with a scan path technique. This program was implemented with an improved deterministic test generation algorithm that makes use of a split model for circuit representation and multiple testability heuristics for efficient search. The program can also interface to a hardware accelerator to speed up the test compaction process. >" @default.
• W2141528506 created "2016-06-24" @default.
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• W2141528506 date "2003-01-07" @default.
• W2141528506 modified "2023-09-25" @default.
• W2141528506 title "An automatic test pattern generation program for large ASICs" @default.
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• W2141528506 doi "https://doi.org/10.1109/iccd.1989.63364" @default.
• W2141528506 hasPublicationYear "2003" @default.
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