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- W2141630027 abstract "We investigated the sputter depth profiling of BaTiO3 by means of Auger Electron Spectroscopy. A quantitative analysis was done for ceramic and single crystal material. Sputtering yield for 2 and 3 keV Ar+ ions was determined. For under UHV conditions fractured specimens no preferential sputtering was found. Mechanically polished or contaminated ceramic specimens show preferential sputtering of Ba or Ti. Using sputtering – heating cycles we succeeded in preparing non-contaminated but ion beam mixed surfaces which are stable upto 150 °C.Fur BaTiO3 wurden mittels Auger-elektronenspektroskopie Tiefenprofilanalysen durchgefuhrt. Keramiken und Einkristalle wurden mittels quantitativer Analyse untersucht und die Sputterrate fur 2 und 3 keV Ar+ Ionen bestimmt. An unter UHV-Bedingungen gebrochenen Proben ist kein bevorzugtes Sputtern zu beobachten. Mechanisch polierte und kontaminierte Keramiken zeigten bevorzugtes Sputtern von Ba und Ti. Mittels Sputter-Heiz-Zyklen konnten erfolgreich nichtkontaminierte aber ionengemischte Oberflachen prapariert werden. Sie blieben bei 150 °C nichtkontaminiert." @default.
- W2141630027 created "2016-06-24" @default.
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- W2141630027 date "1990-10-01" @default.
- W2141630027 modified "2023-09-29" @default.
- W2141630027 title "Auger depth profiling of BaTiO3 ceramics" @default.
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- W2141630027 doi "https://doi.org/10.1002/crat.2170251019" @default.
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