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- W2141794842 abstract "A reliable temperature sensor circuit that is robust against wafer or chip process and sensing temperature variation is introduced. The circuit includes a reference voltage generator and a constant current bias voltage generator in order to compensate for process and sensing temperature variations. This method eliminates post-production adjustments by circuits such as fuses or non-volatile memory devices. It reduces adjustment test costs and silicon area for these devices, their test control circuits and the interface circuits. Temperature measurement variation of less than 0.6/spl deg/C by the proposed circuit with a simple low-power structure was verified. The circuit is implemented for a refresh cycle control in 1.5 times of the PAD space on a low-power pseudo-SRAM type DRAM product with a 0.175-/spl mu/m CMOS bulk process." @default.
- W2141794842 created "2016-06-24" @default.
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- W2141794842 date "2005-07-27" @default.
- W2141794842 modified "2023-09-23" @default.
- W2141794842 title "On-Chip Temperature Sensor with High Tolerance for Process and Temperature Variation" @default.
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- W2141794842 doi "https://doi.org/10.1109/iscas.2005.1464765" @default.
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