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• W2144886543 abstract "Abstract Depth-resolved, Doppler-broadening positron spectroscopy has been used to study structural properties of semiconducting glasses. Bismuth- and lead-doped, silica and germanium glasses with five different compositions were studied. Conducting surface layers in these glasses were obtained by reduction in hydrogen atmosphere. Depth scanning with a slow-positron beam allows to follow the temperature and time evolution of layers modified during reduction processes. However, while reduction processes in inner layers (below a few tens of nm) are clearly seen in changes of the Doppler-broadened positron-annihilation line, the near-to-surface changes are more complex and not fully understood. We prove that the positron spectroscopy can help in optimising technological questions of reduction processes." @default.
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• W2144886543 date "2004-11-01" @default.
• W2144886543 modified "2023-09-24" @default.
• W2144886543 title "Positron-annihilation monitoring of reduction processes in conducting glasses" @default.
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• W2144886543 doi "https://doi.org/10.1016/j.jallcom.2004.06.001" @default.
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