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• W2145095016 abstract "In this paper, the on-wafer measurement of junction depletion capacitance is examined. This work provides an in-depth discussion of possible probing configurations which can be used. It outlines a method to consistently measure the junction capacitances accurately. The results from this method compare favourably with those extracted using S-parameter measurements. Additionally a method is formulated to determine the minimum number of data points required to maintain extraction accuracy." @default.
• W2145095016 created "2016-06-24" @default.
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• W2145095016 date "2003-10-15" @default.
• W2145095016 modified "2023-09-25" @default.
• W2145095016 title "Influence of probing configuration and data set size for bipolar junction capacitance determination" @default.
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• W2145095016 doi "https://doi.org/10.1109/icmts.2002.1193184" @default.
• W2145095016 hasPublicationYear "2003" @default.
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