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• W2145806640 abstract "For many decades, engineers and scientists have studied the effects of high power microwaves (HPM) on electronics. These studies usually focus on means of delivering energy to upset electronic equipment and ways to protect equipment from HPM. The motivation for these studies is to develop the knowledge necessary either to cause disruption or to protect electronics from disruption. Since electronic circuits must absorb sufficient energy to fail and the source used to deliver this energy is far away from the electronic circuit, the source must emit a large quantity of energy. In free space, for example, as the distance between the source and the target increases, the source energy must increase by the square of distance. The HPM community has dedicated substantial resources to the development of higher energy sources as a result. Recently, members of the HPM community suggested a new disruption mechanism that could potentially cause system disruptions at much lower energy levels. The new mechanism, based on nonlinear dynamics, requires an expanded theory of circuit operation. This report summarizes an investigation of electronic circuit nonlinear behavior as it applies to inductor-resistor-diode circuits (known as the Linsay circuit) and phased-locked-loops. With the improvement in computing power and themore » need to model circuit behavior with greater precision, the nonlinear effects of circuit has become very important. In addition, every integrated circuit has as part of its design a protective circuit. These protective circuits use some variation of semiconductor junctions that can interact with parasitic components, present in every real system. Hence, the protective circuit can behave as a Linsay circuit. Although the nonlinear behavior is understandable, it is difficult to model accurately. Many researchers have used classical diode models successfully to show nonlinear effects within predicted regions of operation. However, these models do not accurately predict measured results. This study shows that models based on SPICE, although they exhibit chaotic behavior, do not properly reproduce circuit behavior without modifying diode parameters. This report describes the models and considerations used to model circuit behavior in the nonlinear range of operation. Further, it describes how a modified SPICE diode model improves the simulation results. We also studied the nonlinear behavior of a phased-locked-loop. Phased-locked loops are fundamental building block to many major systems (aileron, seeker heads, etc). We showed that an injected RF signal could drive the phased-locked-loop into chaos. During these chaotic episodes, the frequency of the phased-locked-loop takes excursion outside its normal range of operation. In addition to these excursions, the phased-locked-loop and the system it is controlling requires some time to get back into normal operation. The phased-locked-loop only needs to be upset enough long enough to keep it off balance.« less" @default.
• W2145806640 created "2016-06-24" @default.
• W2145806640 creator A5004353720 @default.
• W2145806640 creator A5035897877 @default.
• W2145806640 creator A5045577359 @default.
• W2145806640 creator A5072728047 @default.
• W2145806640 creator A5088817614 @default.
• W2145806640 date "2004-03-01" @default.
• W2145806640 modified "2023-10-16" @default.
• W2145806640 title "New mechanism for upset of electronics." @default.
• W2145806640 cites W13720662 @default.
• W2145806640 cites W1549386224 @default.
• W2145806640 cites W1563236261 @default.
• W2145806640 cites W1564201208 @default.
• W2145806640 cites W1979684610 @default.
• W2145806640 cites W1998727969 @default.
• W2145806640 cites W2015762645 @default.
• W2145806640 cites W2047286795 @default.
• W2145806640 cites W2124428761 @default.
• W2145806640 cites W3124661333 @default.
• W2145806640 cites W3199549221 @default.
• W2145806640 doi "https://doi.org/10.2172/918748" @default.
• W2145806640 hasPublicationYear "2004" @default.
• W2145806640 type Work @default.
• W2145806640 sameAs 2145806640 @default.
• W2145806640 citedByCount "0" @default.
• W2145806640 crossrefType "report" @default.
• W2145806640 hasAuthorship W2145806640A5004353720 @default.
• W2145806640 hasAuthorship W2145806640A5035897877 @default.
• W2145806640 hasAuthorship W2145806640A5045577359 @default.
• W2145806640 hasAuthorship W2145806640A5072728047 @default.
• W2145806640 hasAuthorship W2145806640A5088817614 @default.
• W2145806640 hasBestOaLocation W21458066402 @default.
• W2145806640 hasConcept C119599485 @default.
• W2145806640 hasConcept C121332964 @default.
• W2145806640 hasConcept C127413603 @default.
• W2145806640 hasConcept C134146338 @default.
• W2145806640 hasConcept C137488568 @default.
• W2145806640 hasConcept C138331895 @default.
• W2145806640 hasConcept C165801399 @default.
• W2145806640 hasConcept C24326235 @default.
• W2145806640 hasConcept C41008148 @default.
• W2145806640 hasConcept C62520636 @default.
• W2145806640 hasConcept C78434282 @default.
• W2145806640 hasConcept C89611455 @default.
• W2145806640 hasConceptScore W2145806640C119599485 @default.
• W2145806640 hasConceptScore W2145806640C121332964 @default.
• W2145806640 hasConceptScore W2145806640C127413603 @default.
• W2145806640 hasConceptScore W2145806640C134146338 @default.
• W2145806640 hasConceptScore W2145806640C137488568 @default.
• W2145806640 hasConceptScore W2145806640C138331895 @default.
• W2145806640 hasConceptScore W2145806640C165801399 @default.
• W2145806640 hasConceptScore W2145806640C24326235 @default.
• W2145806640 hasConceptScore W2145806640C41008148 @default.
• W2145806640 hasConceptScore W2145806640C62520636 @default.
• W2145806640 hasConceptScore W2145806640C78434282 @default.
• W2145806640 hasConceptScore W2145806640C89611455 @default.
• W2145806640 hasLocation W21458066401 @default.
• W2145806640 hasLocation W21458066402 @default.
• W2145806640 hasLocation W21458066403 @default.
• W2145806640 hasOpenAccess W2145806640 @default.
• W2145806640 hasPrimaryLocation W21458066401 @default.
• W2145806640 hasRelatedWork W2011244197 @default.
• W2145806640 hasRelatedWork W2028180791 @default.
• W2145806640 hasRelatedWork W2077601092 @default.
• W2145806640 hasRelatedWork W2158883264 @default.
• W2145806640 hasRelatedWork W2347841389 @default.
• W2145806640 hasRelatedWork W2394454657 @default.
• W2145806640 hasRelatedWork W2547985420 @default.
• W2145806640 hasRelatedWork W2560761700 @default.
• W2145806640 hasRelatedWork W2749582712 @default.
• W2145806640 hasRelatedWork W1968403090 @default.
• W2145806640 isParatext "false" @default.
• W2145806640 isRetracted "false" @default.
• W2145806640 magId "2145806640" @default.
• W2145806640 workType "report" @default.