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- W2146085629 abstract "By using large threshold value in IDDQ tests, test time can be shortened. However, the fault coverage of the IDDQ tests will be affected by process variation. In this paper, effects on fault coverage of IDDQ tests generated by variations of zero biased threshold voltage of each MOS transistor in a circuit under test are examined with a circuit simulator. The result suggests us that IDDQ testing with large threshold value is applicable to production tests of CMOS ICs." @default.
- W2146085629 created "2016-06-24" @default.
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- W2146085629 date "2002-11-08" @default.
- W2146085629 modified "2023-09-25" @default.
- W2146085629 title "Testability analysis of IDDQ testing with large threshold value" @default.
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- W2146085629 doi "https://doi.org/10.1109/dftvs.2000.887177" @default.
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