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• W2146473512 abstract "<para xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> This paper reviews and analyzes a fully integrated electrostatic discharge (ESD)-protected low-noise amplifier (LNA) for low-power and narrowband applications using a cascode inductive source degeneration topology, designed and fabricated in 130-nm CMOS silicon-on-insulator technology. The designed LNA shows 13-dB power gain at 2.4 GHz with a noise figure of 3.6 dB and input return loss of <formula formulatype=inline><tex>$-$</tex></formula>13 dB for power consumption of 6.5 mW. An on-chip “plug-and-play” ESD protection strategy based on diodes and a power clamp is used at the input and output of the LNA, and has an ESD protection level up to 0.8-, 0.9-, and 1.4-A transmission line pulse current. This corresponds to 1.2-, 1.4-, and 2-kV human body model stress applied at, respectively, the RF input, RF output, and <formula formulatype=inline> <tex>$V_{rm DD}$</tex></formula> bus. Measurement shows a minor RF performance degradation by adding the protection diodes. </para>" @default.
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• W2146473512 date "2007-12-01" @default.
• W2146473512 modified "2023-10-17" @default.
• W2146473512 title "A 2.4-GHz Fully Integrated ESD-Protected Low-Noise Amplifier in 130-nm PD SOI CMOS Technology" @default.
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• W2146473512 doi "https://doi.org/10.1109/tmtt.2007.909148" @default.
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