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- W2147217277 abstract "Abstract : A production engineering measure was studied for improvement of production techniques to increase the reliability for the jet etch transistor type 2N501A, with a maximum operating failure rate of 0.01% per 1000 hours at a 90% confidence level at 25 C as an objective. Efforts were made to improve the following seven manufacturing processes: (1) plating edge definition, (2) higher temperature alloys, (3) lead attachments (includes collector attachments), (4) controlled formation of surface oxides for surface stabilization, (5) gettering techniques for encapsulating and sealing, (6) thermal dissipation of package, and (7) leak determination. Establishment of a pilot line to incorporate these process improvements is reported. Preliminary operating stress data o transistors fabric ted on the pilot line indicates an improvement in power handling capability as a result of the process improvements completed. Problems associated with operating stress testing and with obtaining correlation between operating stress testing and storage stress testing are discussed. (Author)" @default.
- W2147217277 created "2016-06-24" @default.
- W2147217277 creator A5060928240 @default.
- W2147217277 date "1963-01-31" @default.
- W2147217277 modified "2023-10-04" @default.
- W2147217277 title "PEM FOR TRANSISTOR MANUFACTURING PROCESS IMPROVEMENT" @default.
- W2147217277 doi "https://doi.org/10.21236/ad0403366" @default.
- W2147217277 hasPublicationYear "1963" @default.
- W2147217277 type Work @default.
- W2147217277 sameAs 2147217277 @default.
- W2147217277 citedByCount "0" @default.
- W2147217277 crossrefType "report" @default.
- W2147217277 hasAuthorship W2147217277A5060928240 @default.
- W2147217277 hasConcept C111919701 @default.
- W2147217277 hasConcept C117671659 @default.
- W2147217277 hasConcept C119599485 @default.
- W2147217277 hasConcept C127413603 @default.
- W2147217277 hasConcept C159985019 @default.
- W2147217277 hasConcept C165801399 @default.
- W2147217277 hasConcept C172385210 @default.
- W2147217277 hasConcept C192562407 @default.
- W2147217277 hasConcept C2987875673 @default.
- W2147217277 hasConcept C41008148 @default.
- W2147217277 hasConcept C98045186 @default.
- W2147217277 hasConceptScore W2147217277C111919701 @default.
- W2147217277 hasConceptScore W2147217277C117671659 @default.
- W2147217277 hasConceptScore W2147217277C119599485 @default.
- W2147217277 hasConceptScore W2147217277C127413603 @default.
- W2147217277 hasConceptScore W2147217277C159985019 @default.
- W2147217277 hasConceptScore W2147217277C165801399 @default.
- W2147217277 hasConceptScore W2147217277C172385210 @default.
- W2147217277 hasConceptScore W2147217277C192562407 @default.
- W2147217277 hasConceptScore W2147217277C2987875673 @default.
- W2147217277 hasConceptScore W2147217277C41008148 @default.
- W2147217277 hasConceptScore W2147217277C98045186 @default.
- W2147217277 hasLocation W21472172771 @default.
- W2147217277 hasOpenAccess W2147217277 @default.
- W2147217277 hasPrimaryLocation W21472172771 @default.
- W2147217277 hasRelatedWork W1830296376 @default.
- W2147217277 hasRelatedWork W2347841574 @default.
- W2147217277 hasRelatedWork W2357259188 @default.
- W2147217277 hasRelatedWork W2360513957 @default.
- W2147217277 hasRelatedWork W2372671187 @default.
- W2147217277 hasRelatedWork W2393396327 @default.
- W2147217277 hasRelatedWork W2941395624 @default.
- W2147217277 hasRelatedWork W3092196391 @default.
- W2147217277 hasRelatedWork W4283744042 @default.
- W2147217277 hasRelatedWork W2012842278 @default.
- W2147217277 isParatext "false" @default.
- W2147217277 isRetracted "false" @default.
- W2147217277 magId "2147217277" @default.
- W2147217277 workType "report" @default.