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• W2148019367 abstract "This paper presents experimental ASER on SOI and BULK SRAMs for the 250-, 130-, and 90-nm technologies. The key parameters controlling soft error rate (SER) in these technologies are modeled with Monte Carlo simulations to predict SER to the 65-nm node." @default.
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• W2148019367 date "2003-12-01" @default.
• W2148019367 modified "2023-09-24" @default.
• W2148019367 title "Comparisons of soft error rate for SRAMs in commercial SOI and bulk below the 130-nm technology node" @default.
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• W2148019367 doi "https://doi.org/10.1109/tns.2003.821588" @default.
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