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- W2149103497 abstract "Novel design-for-testability schemes are suggested to improve the detectability of transistor stuck-on faults, bridgings, and gate oxide shorts in CMOS digital circuits, with limited extra hardware and minimum degradation of circuit performance. One of the techniques makes analog faults detectable by observing the circuit outputs just as for stuck-ats. Also described is a technique in which the gates are modified with the insertion of n-channel FETs whose drains are the input of a ratioed NOR testing logic realized with n-channel drivers and a single resistive p-channel pull-up device. >" @default.
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- W2149103497 date "2003-01-13" @default.
- W2149103497 modified "2023-10-18" @default.
- W2149103497 title "CMOS design for improved IC testability" @default.
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- W2149103497 doi "https://doi.org/10.1109/test.1989.82386" @default.
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