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Matches in SemOpenAlex for { <https://semopenalex.org/work/W2149152016> ?p ?o ?g. }

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• W2149152016 abstract "Heavy-ion-induced single-event transients (SET) are studied by device simulation on an ATMEL spatial component: the CMOS bulk 0.18 mum inverter. The wide temperature range of a spatial environment (from 218 to 418 K) can modify the shape of the SET. Thus, an investigation of the SET propagation through a 10-inverter logic chain is performed in the 218-418 K temperature range, and the threshold LET (LETth) required for unattenuated propagation through the inverter chain is determined. The LETth is calculated for two different locations of the heavy ion impact and for three temperature values. An increase of the sensitivity is found when the temperature is raised from 218 to 418 K." @default.
• W2149152016 created "2016-06-24" @default.
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• W2149152016 date "2008-08-01" @default.
• W2149152016 modified "2023-10-18" @default.
• W2149152016 title "Temperature Effect on Heavy-Ion-Induced Single-Event Transient Propagation in CMOS Bulk 0.18 $mu$m Inverter Chain" @default.
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• W2149152016 doi "https://doi.org/10.1109/tns.2008.2000851" @default.
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