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- W2149942584 abstract "We present measurements of the specific resistivity of a heavily doped n-type InP/InGaAs interface. Transmission line measurements of an InP/GaInAs heterostructure were carried out before and after etching of the GaInAs layer between the pads. The specific interface resistivity was extracted numerically, and error bars were calculated. The obtained specific interface resistivity, averaged on several TLM structures across the wafer, was 1.7 ± 0.36 [Ω-µm2]." @default.
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- W2149942584 date "2011-05-22" @default.
- W2149942584 modified "2023-09-26" @default.
- W2149942584 title "Measurement of the interface specific resistivity of a heavily doped n-type InP/GaInAs heterostructure" @default.
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