Matches in SemOpenAlex for { <https://semopenalex.org/work/W2150609849> ?p ?o ?g. }
Showing items 1 to 96 of
96
with 100 items per page.
- W2150609849 endingPage "971" @default.
- W2150609849 startingPage "967" @default.
- W2150609849 abstract "Abstract Distributions of gate oxide failure in various types of silicon substrate materials have been investigated for a wide range of oxide thicknesses. Silicon substrates containing various well-characterized void distributions along with defect-free materials were tested using special low-series resistance capacitor structures. Results of both ramped field tests of variable ramp rate and constant field tests were performed and analyzed within the framework of Weibull statistics. Ramped field tests are not “time zero dielectric breakdown” tests as is commonly asserted. They can in fact be very useful in extrapolating time dependent failure. The same set of Weibull parameters can be used to describe both ramped field and constant field wearout tests if an appropriate model for the time dependent damage accumulation during the field ramp is used. There are implications for reliability predication and the burn-in screening of device populations containing such defects." @default.
- W2150609849 created "2016-06-24" @default.
- W2150609849 creator A5021894771 @default.
- W2150609849 creator A5032353509 @default.
- W2150609849 creator A5072591299 @default.
- W2150609849 date "2001-07-01" @default.
- W2150609849 modified "2023-09-23" @default.
- W2150609849 title "Dielectric breakdown distributions for void containing silicon substrates" @default.
- W2150609849 cites W1964512626 @default.
- W2150609849 cites W2049556909 @default.
- W2150609849 cites W2069555655 @default.
- W2150609849 cites W2883226319 @default.
- W2150609849 doi "https://doi.org/10.1016/s0026-2714(01)00048-8" @default.
- W2150609849 hasPublicationYear "2001" @default.
- W2150609849 type Work @default.
- W2150609849 sameAs 2150609849 @default.
- W2150609849 citedByCount "2" @default.
- W2150609849 crossrefType "journal-article" @default.
- W2150609849 hasAuthorship W2150609849A5021894771 @default.
- W2150609849 hasAuthorship W2150609849A5032353509 @default.
- W2150609849 hasAuthorship W2150609849A5072591299 @default.
- W2150609849 hasConcept C105795698 @default.
- W2150609849 hasConcept C111368507 @default.
- W2150609849 hasConcept C119599485 @default.
- W2150609849 hasConcept C127313418 @default.
- W2150609849 hasConcept C127413603 @default.
- W2150609849 hasConcept C133386390 @default.
- W2150609849 hasConcept C152909973 @default.
- W2150609849 hasConcept C159985019 @default.
- W2150609849 hasConcept C165801399 @default.
- W2150609849 hasConcept C172385210 @default.
- W2150609849 hasConcept C173291955 @default.
- W2150609849 hasConcept C192562407 @default.
- W2150609849 hasConcept C2361726 @default.
- W2150609849 hasConcept C24326235 @default.
- W2150609849 hasConcept C2777289219 @default.
- W2150609849 hasConcept C2779772531 @default.
- W2150609849 hasConcept C33923547 @default.
- W2150609849 hasConcept C49040817 @default.
- W2150609849 hasConcept C52192207 @default.
- W2150609849 hasConcept C544956773 @default.
- W2150609849 hasConcept C70401718 @default.
- W2150609849 hasConcept C77595967 @default.
- W2150609849 hasConceptScore W2150609849C105795698 @default.
- W2150609849 hasConceptScore W2150609849C111368507 @default.
- W2150609849 hasConceptScore W2150609849C119599485 @default.
- W2150609849 hasConceptScore W2150609849C127313418 @default.
- W2150609849 hasConceptScore W2150609849C127413603 @default.
- W2150609849 hasConceptScore W2150609849C133386390 @default.
- W2150609849 hasConceptScore W2150609849C152909973 @default.
- W2150609849 hasConceptScore W2150609849C159985019 @default.
- W2150609849 hasConceptScore W2150609849C165801399 @default.
- W2150609849 hasConceptScore W2150609849C172385210 @default.
- W2150609849 hasConceptScore W2150609849C173291955 @default.
- W2150609849 hasConceptScore W2150609849C192562407 @default.
- W2150609849 hasConceptScore W2150609849C2361726 @default.
- W2150609849 hasConceptScore W2150609849C24326235 @default.
- W2150609849 hasConceptScore W2150609849C2777289219 @default.
- W2150609849 hasConceptScore W2150609849C2779772531 @default.
- W2150609849 hasConceptScore W2150609849C33923547 @default.
- W2150609849 hasConceptScore W2150609849C49040817 @default.
- W2150609849 hasConceptScore W2150609849C52192207 @default.
- W2150609849 hasConceptScore W2150609849C544956773 @default.
- W2150609849 hasConceptScore W2150609849C70401718 @default.
- W2150609849 hasConceptScore W2150609849C77595967 @default.
- W2150609849 hasIssue "7" @default.
- W2150609849 hasLocation W21506098491 @default.
- W2150609849 hasOpenAccess W2150609849 @default.
- W2150609849 hasPrimaryLocation W21506098491 @default.
- W2150609849 hasRelatedWork W1826348476 @default.
- W2150609849 hasRelatedWork W1958623508 @default.
- W2150609849 hasRelatedWork W1964180067 @default.
- W2150609849 hasRelatedWork W1981242742 @default.
- W2150609849 hasRelatedWork W2036177285 @default.
- W2150609849 hasRelatedWork W2092669974 @default.
- W2150609849 hasRelatedWork W2097860392 @default.
- W2150609849 hasRelatedWork W2100989783 @default.
- W2150609849 hasRelatedWork W2108898163 @default.
- W2150609849 hasRelatedWork W2116243497 @default.
- W2150609849 hasRelatedWork W2120411674 @default.
- W2150609849 hasRelatedWork W2155551404 @default.
- W2150609849 hasRelatedWork W2164951930 @default.
- W2150609849 hasRelatedWork W2166157263 @default.
- W2150609849 hasRelatedWork W2536830517 @default.
- W2150609849 hasRelatedWork W2548382215 @default.
- W2150609849 hasRelatedWork W2983771052 @default.
- W2150609849 hasRelatedWork W3150712682 @default.
- W2150609849 hasRelatedWork W1993495576 @default.
- W2150609849 hasRelatedWork W2142376321 @default.
- W2150609849 hasVolume "41" @default.
- W2150609849 isParatext "false" @default.
- W2150609849 isRetracted "false" @default.
- W2150609849 magId "2150609849" @default.
- W2150609849 workType "article" @default.