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- W2150644609 abstract "VLSI components testing---in particular, concerning microprocessors---is an essential step during design and production of fault-tolerant complex systems. Actually, an efficient general method should adapt to such different phases as incoming acceptance, periodical testing, maintenance, and even design of self-testing and fault-tolerant units.Most authors presenting this problem in recent papers advocated functional approaches as the most promising, or even the only possible, ones. In the present paper the problem is analyzed with the purpose of identifying a general criterion capable of leading to semiautomatic test pattern generators through formal definition of the test approach itself. To this end, microprogramming is adopted for creating the functional model of a VLSI programmable device, starting from user-available information.The approach aims at identifying the presence of faulty behavior error rather than at localizing its physical source fault. This appears to be reasonable, given the testing criterion applications listed above. It will be seen that, although a degree of freedom exists in defining device model and error model, basic characteristics are independent of it and lead to necessary conditions for error coverage." @default.
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- W2150644609 date "1982-01-01" @default.
- W2150644609 modified "2023-09-25" @default.
- W2150644609 title "Software testing techniques for universal building blocks of multimicrosystems" @default.
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- W2150644609 doi "https://doi.org/10.1145/1500774.1500789" @default.
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