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- W2153448514 endingPage "73" @default.
- W2153448514 startingPage "71" @default.
- W2153448514 abstract "Abstract. To measure the performance of electronic components when stressed by High Power Microwave signals a setup was designed and tested which allows a well-defined voltage signal to enter the component during normal operation, and to discriminate its effect on the component. The microwave signal is fed to the outside conductor of a coaxial cable and couples into the inner signal line connected to the device under test (DUT). The disturbing HF-signal is transferred almost independent from frequency to maintain the pulse shape in the time domain. The configuration designed to perform a TEM-coupling within a 50 Ohm system prevents the secondary system from feeding back to the primary system and, due to the geometrical parameters chosen, the coupling efficiency is as high as 50–90%. Linear dimensions and terminations applied allow for pulses up to a width of 12ns and up to a voltage level of 4–5 kV on the outside conductor. These pulse parameters proved to be sufficient to upset the DUTs tested so far. In more than 400 measurements a rectangular pulse of increasing voltage level was applied to different types of CMOS and TTL until the individual DUT was damaged. As well the pulse width (3, 6 or 12 ns) and its polarity were varied in single-shot or repetitive-shot experiments (500 shots per voltage at a repetition rate of 3 Hz). The state of the DUT was continuously monitored by measuring both the current of the DUT circuit and that of the oscillator providing the operating signal for the DUT. The results show a very good reproducibility within a set of identical samples, remarkable differences between manufacturers and lower thresholds for repetitive testing, which indicates a memory effect of the DUT to exist for voltage levels significantly below the single-shot threshold." @default.
- W2153448514 created "2016-06-24" @default.
- W2153448514 creator A5069716647 @default.
- W2153448514 creator A5072834116 @default.
- W2153448514 date "2005-05-27" @default.
- W2153448514 modified "2023-10-16" @default.
- W2153448514 title "Measuring the upset of CMOS and TTL due to HPM-signals" @default.
- W2153448514 doi "https://doi.org/10.5194/ars-2-71-2004" @default.
- W2153448514 hasPublicationYear "2005" @default.
- W2153448514 type Work @default.
- W2153448514 sameAs 2153448514 @default.
- W2153448514 citedByCount "1" @default.
- W2153448514 crossrefType "journal-article" @default.
- W2153448514 hasAuthorship W2153448514A5069716647 @default.
- W2153448514 hasAuthorship W2153448514A5072834116 @default.
- W2153448514 hasBestOaLocation W21534485141 @default.
- W2153448514 hasConcept C119599485 @default.
- W2153448514 hasConcept C121332964 @default.
- W2153448514 hasConcept C127413603 @default.
- W2153448514 hasConcept C165801399 @default.
- W2153448514 hasConcept C199360897 @default.
- W2153448514 hasConcept C24890656 @default.
- W2153448514 hasConcept C2778002589 @default.
- W2153448514 hasConcept C2779843651 @default.
- W2153448514 hasConcept C41008148 @default.
- W2153448514 hasConcept C44838205 @default.
- W2153448514 hasConcept C51221625 @default.
- W2153448514 hasConcept C76155785 @default.
- W2153448514 hasConcept C78519656 @default.
- W2153448514 hasConceptScore W2153448514C119599485 @default.
- W2153448514 hasConceptScore W2153448514C121332964 @default.
- W2153448514 hasConceptScore W2153448514C127413603 @default.
- W2153448514 hasConceptScore W2153448514C165801399 @default.
- W2153448514 hasConceptScore W2153448514C199360897 @default.
- W2153448514 hasConceptScore W2153448514C24890656 @default.
- W2153448514 hasConceptScore W2153448514C2778002589 @default.
- W2153448514 hasConceptScore W2153448514C2779843651 @default.
- W2153448514 hasConceptScore W2153448514C41008148 @default.
- W2153448514 hasConceptScore W2153448514C44838205 @default.
- W2153448514 hasConceptScore W2153448514C51221625 @default.
- W2153448514 hasConceptScore W2153448514C76155785 @default.
- W2153448514 hasConceptScore W2153448514C78519656 @default.
- W2153448514 hasLocation W21534485141 @default.
- W2153448514 hasOpenAccess W2153448514 @default.
- W2153448514 hasPrimaryLocation W21534485141 @default.
- W2153448514 hasRelatedWork W1864114156 @default.
- W2153448514 hasRelatedWork W2055216986 @default.
- W2153448514 hasRelatedWork W2151041583 @default.
- W2153448514 hasRelatedWork W2340228732 @default.
- W2153448514 hasRelatedWork W2355383665 @default.
- W2153448514 hasRelatedWork W2362880085 @default.
- W2153448514 hasRelatedWork W2381233679 @default.
- W2153448514 hasRelatedWork W2392503169 @default.
- W2153448514 hasRelatedWork W2899084033 @default.
- W2153448514 hasRelatedWork W3030385680 @default.
- W2153448514 hasVolume "2" @default.
- W2153448514 isParatext "false" @default.
- W2153448514 isRetracted "false" @default.
- W2153448514 magId "2153448514" @default.
- W2153448514 workType "article" @default.