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• W2154471431 abstract "The Register level Test Generator (RTG) system is a software tool that automatically develops test patterns to detect all classical single “stuck-at” faults in a digital circuit. In its current state RTG is targeted for boards containing SSI, MSI, and small LSI components. RTG combines an efficient technique for modeling sequential components at the register level with a simple set of testability design rules, and a powerful test generation algorithm. Thus far in its development RTG has been shown to be a useful tool, typically capable of generating a 100% fault coverage test for a 50 IC board in about 30 CPU minutes on a VAX1 11/780 running UNIX.2" @default.
• W2154471431 created "2016-06-24" @default.
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• W2154471431 date "1985-06-01" @default.
• W2154471431 modified "2023-09-23" @default.
• W2154471431 title "RTG: Automatic Register Level Test Generator" @default.
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• W2154471431 doi "https://doi.org/10.5555/317825.317999" @default.
• W2154471431 hasPublicationYear "1985" @default.
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