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• W2155462575 abstract "Emerging non-volatile memories such as phase-change RAM (PCRAM) offer significant advantages but suffer from write endurance problems. However, prior solutions are oblivious to soft errors (recently raised as a potential issue even for PCRAM) and are incompatible with high-level fault tolerance techniques such as chipkill. To additionally address such failures requires unnecessarily high costs for techniques that focus singularly on wear-out tolerance. In this paper, we propose fine-grained remapping with ECC and embedded pointers (FREE-p). FREE-p remaps fine-grained worn-out NVRAM blocks without requiring large dedicated storage. We discuss how FREE-p protects against both hard and soft errors and can be extended to chipkill. Further, FREE-p can be implemented purely in the memory controller, avoiding custom NVRAM devices. In addition to these benefits, FREE-p increases NVRAM lifetime by up to 26% over the state-of-the-art even with severe process variation while performance degradation is less than 2% for the initial 7 years." @default.
• W2155462575 created "2016-06-24" @default.
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• W2155462575 date "2011-02-01" @default.
• W2155462575 modified "2023-10-18" @default.
• W2155462575 title "FREE-p: Protecting non-volatile memory against both hard and soft errors" @default.
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• W2155462575 doi "https://doi.org/10.1109/hpca.2011.5749752" @default.
• W2155462575 hasPublicationYear "2011" @default.
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